Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z
Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z
Hibex > Products > CATS > Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z
Semiconductor test system (TRANSISTOR, MOS-FET, IGBT, DIODE) CATL 2010 Z
CATS
It is a system developed as a wafer measuring instrument by prober and can measure DC characteristics and L load test at one place. Unit management is also possible for measurement programs and measurement results, as well as a wafer map function.
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