Semiconductor test system (MOS-FET, IGBT, THYRISTOR, DIODE) CHT 3012 ZZ
Semiconductor test system (MOS-FET, IGBT, THYRISTOR, DIODE) CHT 3012 ZZ
Hibex > Products > CATS > Semiconductor test system (MOS-FET, IGBT, THYRISTOR, DIODE) CHT 3012 ZZ
Semiconductor test system (MOS-FET, IGBT, THYRISTOR, DIODE) CHT 3012 ZZ
CATS
It is the latest model of DC measuring tester for power semiconductor, and has the application capability of 3 kV – 1200 A The measuring table of the photo has a heater stage and it is possible to raise the temperature up to 200 ℃.
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